Abstract:In order to achieve the parameter identification and reduce the diagnosis cost of analog circuit

Unlike the methods based on digital signal processing (DSP) or artificial intelligence

a new method based on matrix perturbation theory for analog circuit fault diagnosis is proposed. in the view of algebraic theories

And by analyzing the problems of fault modeling

fault feature extraction and the tolerance handling in fault diagnosis for analog circuit

this paper attempts to construct a theoretical framework that integrates fault detection

fault location and parameter identification based on the relationship between the device parameters and response matrix eigenvalues. By comparing the proposed model with its counterparts

the experimental results show that the proposed model outperforms its counterparts in the respect of computational cost and fault parameter identification. In two experiments

the identification errors are less than 2.35%.