Liu Xiaoming,Shi Hongfei,Chen Hai,et al.Analysis of the influence factors of post-arc dielectric recovery on DC vacuum circuit breaker[J].Advanced Engineering Sciences,2023,55(3):40–47
Liu Xiaoming,Shi Hongfei,Chen Hai,et al.Analysis of the influence factors of post-arc dielectric recovery on DC vacuum circuit breaker[J].Advanced Engineering Sciences,2023,55(3):40–47 DOI: 10.15961/j.jsuese.202200954.